Single and multilayer porous silicon structures for photonic applications

Porous silicon (PS) apart from its diverse properties from bulk Si is also identified to be a photonic material. PS single and multilayer samples are prepared on a polished surface of (1 0 0) Si substrate. A peak fitting technique has been discussed for XRD analysis in the case of a dichromatic beam. Theoretical simulations of light transmission for some special structures are also presented.