Title of article :
Topology and chemical order in AsxGexSe1 − 2x glasses: A high-resolution X-ray photoelectron spectroscopy study
Author/Authors :
Golovchak، نويسنده , , R. and Shpotyuk، نويسنده , , O. and Iovu، نويسنده , , M. and Kovalskiy، نويسنده , , A. and Jain، نويسنده , , H.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2011
Abstract :
The evolution of topology and chemical order along the AsxGexSe1 − 2x composition-line within the As–Ge–Se glass-forming region is studied by high-resolution X-ray photoelectron spectroscopy. It is shown that cation–cation bond formation becomes a dominant process for the compositions with x > 0.09. The results explain the peculiarities observed around this composition recently in the temperature-modulated differential scanning calorimetry data. Substitution of two selenium atoms within constituent structural units (pyramids and/or tetrahedra) by corresponding cations explains a second peculiarity point at x > 0.16 compositions observed recently with the above technique. The present observations show segregation of As and then Ge at high concentrations of cations in the system (x > 0.20).
Keywords :
Chalcogenide glass , Electronic and atomic structure , XPS
Journal title :
Journal of Non-Crystalline Solids
Journal title :
Journal of Non-Crystalline Solids