Modeling of progressive delamination in a thin film driven by diffusion-induced stresses

A semi-analytical method based on the cohesive model has been developed to investigate the progressive growth of interface delamination in an axisymmetric thin film electrode driven by diffusion-induced stresses under the assumption that the electrode remains elastic during the Li-ion diffusion process. The evolutions of the cohesive zone and debonding zone with respect to charging time have been predicted. The cohesive zone propagates in an accelerating manner and the debonding zone advances in a slowing down manner. The key parameters that control the interfacial stresses and delamination have been identified from the obtained governing equations. And according to the discussions on the key parameters, design insights into the geometry, charging velocity and material properties of the electrode have been provided.