Epitaxial growth of non-c-oriented ferroelectric SrBi2Ta2O9 thin films on SrTiO3 substrates

Non-c-axis-oriented SrBi2Ta2O9 (SBT) epitaxial thin films with (116)- and (103)-orientations have been grown on Nb-doped (011)- and (111)-oriented SrTiO3 (STO) substrates by pulsed laser deposition, respectively. Analyses of the X-ray diffraction pole figures revealed that the three-dimensional epitaxy orientation relationship SBT001STO001; SBT11̄0STO100 is valid for both cases of SBT thin films, irrespective of STO orientations. The measured remanent polarizations (2Pr) of (116)-oriented and (103)-oriented SBT films were 9.6 and 10.4 μC/cm2, respectively, for a maximum applied electric field of 320 kV/cm. The dielectric constants of (116)- and (103)-oriented SBT were estimated as 155 and 189, respectively.