Title of article :
Characterisation of thick film resistor series for strain sensors
Author/Authors :
Hrovat، نويسنده , , Marko and Belavic?، نويسنده , , Darko and Samard?ija، نويسنده , , Zoran، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
4
From page :
2001
To page :
2004
Abstract :
Some 10 kohm/sq. thick film resistors based on RuO2, ruthenates or a mixture of RuO2 and ruthenates, were evaluated for strain gauge applications. The resistors were fired at different temperatures to estimate the influence of firing temperature on the electrical characteristics. Temperature coefficients of resistivity (TCR), noise indices and gauge factors (GF) were measured. Microstructures of the thick film resistors were analysed by SEM. The results indicate that the microstructure of thick film resistors influences the gauge factors much more significantly than the “nature” of the conductive phase.
Keywords :
Sensors , Thick film resistors , Electrical properties , films
Journal title :
Journal of the European Ceramic Society
Serial Year :
2001
Journal title :
Journal of the European Ceramic Society
Record number :
1405470
Link To Document :
بازگشت