Uncertainty of complex permittivity measurements by split-post dielectric resonator technique

Split-post dielectric resonators operating at frequencies 1.4–5.5 GHz were used to measure complex permittivity of single crystal standard reference dielectric materials with well known dielectric properties previously measured by other techniques. Detailed error analysis of permittivity and dielectric loss tangent measurements has been performed. It was proved both theoretically and experimentally that using split post resonators it is possible to measure permittivity with uncertainty about 0.3% and dielectric loss tangent with resolution 2×10−5 for well-machined laminar specimens.