Title of article :
Preparation and characterization of Zn18O/Zn16O isotope heterostructure thin films
Author/Authors :
Matsumoto، نويسنده , , Kenji and Adachi، نويسنده , , Yutaka and Sakaguchi، نويسنده , , Isao and Ohashi، نويسنده , , Naoki and Haneda، نويسنده , , Hajime، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Pages :
6
From page :
423
To page :
428
Abstract :
An oxygen isotope-based heterostructure zinc oxide (ZnO) thin film, Zn16O/Zn18O/Zn16O, was made by pulsed laser deposition on an a-face sapphire substrate. The isotope-enriched Zn18O layer was made by irradiation of the isotope oxygen radical (18O*). The isotopic ratio in the heterostructure film was analyzed via secondary ion mass spectroscopy (SIMS). The ratio of exchange from 16O to 18O was approximately 70% when the oxygen isotope was irradiated as a radical, while it was approximately 10% when the oxygen isotope was supplied as 18O2 gas.
Keywords :
Defects , films , ZNO , SIMS
Journal title :
Journal of the European Ceramic Society
Serial Year :
2010
Journal title :
Journal of the European Ceramic Society
Record number :
1411180
Link To Document :
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