Author/Authors :
Schmeiكer، نويسنده , , Dieter and Appel، نويسنده , , Günter and Bِhme، نويسنده , , Oliver and Heller، نويسنده , , Thomas and Mikalo، نويسنده , , Ricardo P. and Hoffmann، نويسنده , , Patrick and Batchelor، نويسنده , , David، نويسنده ,
Abstract :
The spectroscopic characterization of localized charges in thin film devices is addressed. We demonstrate their existence and show their particular contribution to the operation of sensor devices. Examples in oxidic and polymeric thin films systems are given in which the localized states dominate the electronic properties.
