Computational quantification and correction of the errors induced by layer removal for subsurface residual stress measurements

X-ray diffraction combined with electropolishing layer removal is a major technique for subsurface residual stress measurement. The layer removal steps inevitably change the stress fields within the remaining material and thus the stress measurements must be corrected. In this paper, an existing FE-based methodology is improved and compared with the Moore and Evans correction. Stress relaxation caused by different layer removal methods is calculated numerically and the applicability of the proposed correction method is discussed. The results indicate that although the FE-based correction method also has some limitations, it is more versatile and accurate than the Moore and Evans correction.