Title of article :
An empirical approach to explain the material removal rate for copper chemical mechanical polishing
Author/Authors :
Guoshun، نويسنده , , Pan and Ning، نويسنده , , Wang and Hua، نويسنده , , Gong and Yan، نويسنده , , Liu، نويسنده ,
Issue Information :
ماهنامه با شماره پیاپی سال 2012
Pages :
3
From page :
142
To page :
144
Abstract :
In this paper, an empirical expression was deduced based on the experimental data for material removal rate of copper chemical mechanical polishing. The parameters of this expression includes the initial chemical corrosion rate(MRR0), the corrosion inhibition efficiency(k) and the mechanical abrading rate(MRRM). The deduced empirical expression revealed that under certain slurry systems, the corrosion inhibition efficiency may always keep unchanged, which may be useful to characterize the inhibition properties of different inhibitors.
Keywords :
chemical mechanical polishing , BTA , Chelating ligand , Material Removal Rate
Journal title :
Tribology International
Serial Year :
2012
Journal title :
Tribology International
Record number :
1426626
Link To Document :
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