Title of article :
Nano–level finishing of single crystal silicon blank using magnetorheological finishing process
Author/Authors :
Ajay Sidpara، نويسنده , , Ajay and Jain، نويسنده , , V.K.، نويسنده ,
Issue Information :
ماهنامه با شماره پیاپی سال 2012
Pages :
8
From page :
159
To page :
166
Abstract :
Magnetorheological finishing (MRF) utilizes magnetorheological (MR) fluid, which consists of magnetic particles, nonmagnetic abrasives, and some additives in water or other carrier to polish the materials. An experimental study is conducted to predict the effect of process parameters (concentration of magnetic particles and abrasive particles, carrier wheel speed, and initial surface roughness) on surface finish and material removal rate in MRF of single crystal silicon blank. The final surface roughness value in terms of arithmetical mean roughness (Ra) obtained is as low as 8 nm from the initial value of 1300 nm. An optimization study is also carried out to find optimum values of process parameters from the selected range.
Keywords :
Polishing , Roughness , Material removal , Abrasive
Journal title :
Tribology International
Serial Year :
2012
Journal title :
Tribology International
Record number :
1426628
Link To Document :
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