Title of article :
Post flight analysis of the surface plasmon resonance enhanced photoelastic modulated ellipsometry
Author/Authors :
Chao، نويسنده , , Yu-Faye and Han، نويسنده , , Chien-Yuan، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
6
From page :
490
To page :
495
Abstract :
A total internal reflection ellipsometer equipped with a photoelastic modulator (PEM) is installed to investigate the chemical activation and antibody immobilization process on thin gold films. We set up two detection channels in this configuration: one for real-time monitoring with a data rate of 1 set per second, and the other for post flight analysis with a data rate of 25,000 sets per second. More detailed information has been obtained through the post flight analysis technique during the chemical activation process. This surface plasmon resonance enhanced PEM ellipsometry provides higher sensitivity and temporal resolution. It is feasible to resolve a faster reaction such as chemical reaction or protein folding by the post flight analysis technique.
Keywords :
ellipsometry , surface plasmon resonance , Photoelastic modulator
Journal title :
Sensors and Actuators B: Chemical
Serial Year :
2007
Journal title :
Sensors and Actuators B: Chemical
Record number :
1435694
Link To Document :
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