• Title of article

    Post flight analysis of the surface plasmon resonance enhanced photoelastic modulated ellipsometry

  • Author/Authors

    Chao، نويسنده , , Yu-Faye and Han، نويسنده , , Chien-Yuan، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2007
  • Pages
    6
  • From page
    490
  • To page
    495
  • Abstract
    A total internal reflection ellipsometer equipped with a photoelastic modulator (PEM) is installed to investigate the chemical activation and antibody immobilization process on thin gold films. We set up two detection channels in this configuration: one for real-time monitoring with a data rate of 1 set per second, and the other for post flight analysis with a data rate of 25,000 sets per second. More detailed information has been obtained through the post flight analysis technique during the chemical activation process. This surface plasmon resonance enhanced PEM ellipsometry provides higher sensitivity and temporal resolution. It is feasible to resolve a faster reaction such as chemical reaction or protein folding by the post flight analysis technique.
  • Keywords
    ellipsometry , surface plasmon resonance , Photoelastic modulator
  • Journal title
    Sensors and Actuators B: Chemical
  • Serial Year
    2007
  • Journal title
    Sensors and Actuators B: Chemical
  • Record number

    1435694