Title of article :
Overview on SiN surface passivation of crystalline silicon solar cells
Author/Authors :
Aberle، نويسنده , , Armin G، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Abstract :
Silicon nitride (SiN) fabricated by plasma-enhanced chemical vapour deposition (PECVD) is increasingly used within the crystalline silicon (c-Si) photovoltaic industry as it offers the possibility to fabricate a surface and bulk passivating antireflection coating at low temperature (⩽450°C). This article presents an overview on the present status of SiN for industrial as well as laboratory-type c-Si solar cells. Topics covered include the fundamentals of the PECVD technology, the present status of high-throughput PECVD machines for the deposition of SiN onto c-Si wafers, and a review of the fundamental properties of Si–SiN interfaces fabricated by PECVD.
Keywords :
Photovoltaics , Silicon solar cells , Silicon nitride , Surface passivation , PECVD
Journal title :
Solar Energy Materials and Solar Cells
Journal title :
Solar Energy Materials and Solar Cells