Author/Authors :
Kaminski، نويسنده , , Vandelle، Elodie نويسنده , , B and Fave، نويسنده , , A and Boyeaux، نويسنده , , J.P and Nam، نويسنده , , Le Quan and Monna، نويسنده , , R and Sarti، نويسنده , , D and Laugier، نويسنده , , A، نويسنده ,
Abstract :
The purpose of this work is to develop a back surface field (BSF) for industrial crystalline silicon solar cells and thin-film solar cells applications. Screen-printed and sputtered BSFs have been realised on structures which already have a n+p back junction due to the diffusion of the phosphorus in both faces of the wafer during solar cell emitter elaboration. Rapid thermal annealing temperatures from 700°C to 1000°C have been used. Thickness of the BSF has been measured by SIMS and confronted to the theoretical expected value and simulations. Electrical and optical measurements have been done in order to characterise the BSF. For 250 μm thick industrial solar cells, 6% relative increase in photocurrent has been reached.
Keywords :
Back surface field , screen printing , sputtering , Silicon