Effect of substrate temperature on the structure and optical properties of CdTe thin film

The present work deals with the preparation, structure and optical characterization of cadmium telluride (CdTe) thin films. These films are formed by vacuum evaporation on the well-cleaned glass substrates. The compositional analyses are made by energy dispersive analysis by X-ray. The thicknesses of the samples are measured by multiple beam interferometry. The samples are prepared at different substrate temperatures. The X-ray diffraction has been employed to study the structure of the film. The structures of the samples are found to be crystalline and the crystallite size increases with the increase of substrate temperature. The d-spacing and lattice parameters of the samples are calculated and the results are also discussed. Optical characteristics of the CdTe samples have been analyzed using spectrophotometer in the wavelength range of 400–800 nm. The transmittance is found to decrease with the increase of film thickness. The transmittance falls steeply with decreasing wavelength. It reveals that CdTe films are having considerable absorption throughout the wavelength region (400–800 nm). The optical band gap energy has been evaluated from the plot of α2 vs. hν. Two possible direct transitions have been observed for all the CdTe films in visible region. The observed allowed transition may be attributed due to the spin orbit splitting of the valence band.