Title of article :
Lifetimes of organic photovoltaics: Using TOF-SIMS and 18O2 isotopic labelling to characterise chemical degradation mechanisms
Author/Authors :
Norrman، نويسنده , , Kion and Krebs، نويسنده , , Frederik C.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
15
From page :
213
To page :
227
Abstract :
The lifetimes of organic photovoltaic cells based on conjugated polymer materials were studied. The device geometry was glass:ITO:PEDOT:PSS:C12-PSV:C60:aluminium. To characterise and elucidate the parts of the degradation mechanisms induced by molecular oxygen, 18O2 isotopic labelling was employed in conjunction with time-of-flight secondary ion mass spectrometry. A comparison was made between devices being kept in the dark and devices that had been subjected to illumination under simulated sunlight (1000 W m−2, AM1.5) and this demonstrated that oxygen-containing species were generated throughout the active layer with the largest concentration towards the aluminium electrode. For devices that had been kept in the dark oxygen species were only observed at the immediate interface between the aluminium and the organic layer. The isotopic labelling allowed us to demonstrate that the oxygen comes from the atmosphere and diffuses through the aluminium electrode and into the device.
Keywords :
TOF-SIMS , Organic Photovoltaics , Oxygen isotopic labelling , Lifetimes , Degradation mechanism , Polymer photovoltaics , Secondary ion mass spectrometry
Journal title :
Solar Energy Materials and Solar Cells
Serial Year :
2006
Journal title :
Solar Energy Materials and Solar Cells
Record number :
1480090
Link To Document :
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