Title of article :
Thin film silicon n–i–p solar cells deposited by VHF PECVD at 100 °C substrate temperature
Author/Authors :
Brinza، نويسنده , , Wim M. and Rath، نويسنده , , J.K. and Schropp، نويسنده , , R.E.I.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
4
From page :
680
To page :
683
Abstract :
The applicability of the very high frequency (VHF) plasma-enhanced chemical vapor deposition (PECVD) technique to the fabrication of solar cells in an n–i–p configuration at 100 °C substrate temperature is being investigated. Amorphous and microcrystalline silicon cells are made with the absorber layers grown in conditions close to the amorphous-to-microcrystalline transition, which proved to give the best quality layers. It was observed that post-deposition annealing at 100 °C resulted in a relative increase of the efficiency of up to 50% for both amorphous and microcrystalline cells. For an amorphous solar cell deposited on stainless steel foil with a non-textured back reflector, an efficiency of 5.3% was achieved. A too rough substrate (textured back reflector), with an rms roughness higher than 80 nm, was found to give rise to shunting paths.
Keywords :
Silicon , Microcrystalline , PECVD , Thin film , solar cell , low temperature , Amorphous
Journal title :
Solar Energy Materials and Solar Cells
Serial Year :
2009
Journal title :
Solar Energy Materials and Solar Cells
Record number :
1482549
Link To Document :
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