Title of article :
ALD grown bilayer junction of ZnO:Al and tunnel oxide barrier for SIS solar cell
Author/Authors :
Bethge، نويسنده , , O. and Nobile، نويسنده , , M. and Abermann، نويسنده , , S. D. Glaser ، نويسنده , , M. and Bertagnolli، نويسنده , , E.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2013
Pages :
5
From page :
178
To page :
182
Abstract :
Various metal oxides are probed as extrinsic thin tunnel barriers in Semiconductor Insulator Semiconductor solar cells. Namely Al2O3, ZrO2, Y2O3, and La2O3 thin films are in between n-type ZnO:Al (AZO) and p-type Si substrates by means of Atomic Layer Deposition. Low reverse dark current–density as low as 3×10−7 A/cm2, a fill factor up to 71.3%, and open-circuit voltage as high as 527 mV are obtained, achieving conversion efficiency of 8% for the rare earth oxide La2O3. ZrO2 and notably Al2O3 show drawbacks in performance suggesting an adverse reactivity with AZO as also indicated by X-ray Photoelectron Spectroscopy.
Keywords :
SIS solar cell , azo , Tunnel barrier , ALD , metal oxides , XPS
Journal title :
Solar Energy Materials and Solar Cells
Serial Year :
2013
Journal title :
Solar Energy Materials and Solar Cells
Record number :
1488323
Link To Document :
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