Author/Authors :
Szytu?a، نويسنده , , A. and Ba?anda، نويسنده , , M. and Kaczorowski، نويسنده , , Joseph D. and Baran، نويسنده , , S. and Gondek، نويسنده , , ?. and Hern?ndez-Velasco، نويسنده , , J. and Penc، نويسنده , , B. and Stü?er، نويسنده , , N. and Wawrzy?ska، نويسنده , , E.، نويسنده ,
Abstract :
Magnetization, magnetic susceptibility, electrical resistivity, thermoelectric power, neutron diffraction and X-Ray photoemission spectroscopy measurements were performed on polycrystalline samples of PrAg2Ge2 and NdAg2Ge2, both crystallizing with a tetragonal structure of the ThCr2Si2-type. The data indicate that both compounds order magnetically at low temperatures, PrAg2Ge2 at 12 K and NdAg2Ge2 at 2 K. Neutron diffraction data for the latter indicate antiferromagnetic collinear structure described by the propagation vector k=(½, 0, ½) at 1.5 K. Both compounds exhibit metallic-like electrical behavior. The X-Ray photoemission data indicate that the valence bands are formed mainly by the Ag 4d bands. The spin-orbit splitting values determined from the XPS spectra of Pr and Nd, 3d5/2 and 3d3/2, equal 20.5 eV for the Pr compound and 22.7 eV for the Nd compound. The analysis of these spectra performed on the basis of the Gunnarsson-Schِnhammer model indicates a weak hybridization of the 4f electrons with the conduction band.
