Title of article
Enantiomorph identification of crystals belonging to the point groups of 622 and 6 by convergent-beam electron diffraction method
Author/Authors
Fujii، نويسنده , , Akihiro and Sakamoto، نويسنده , , Hiroki and Fujio، نويسنده , , Satoshi and Tanaka، نويسنده , , Katsushi and Inui، نويسنده , , Haruyuki، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
14
From page
154
To page
167
Abstract
A CBED method proposed by the present authors for chiral identification of enantiomorphic crystals has been successfully applied to crystals with the point groups of 622 and 6. The intensity asymmetry of ZOLZ and/or FOLZ reflections of the Bijvoet pairs is utilized for enantiomorph identification and such intensity asymmetry is noted regardless of beam convergence angle but the extent to which the asymmetry is noted depends on crystal thickness and accelerating voltage. The crystal thickness should be smaller than the extinction distance of relevant reflections that constitute ‘umweganregung’ in multiple scattering, which is responsible for the intensity asymmetry. As a result, the maximum crystal thickness, below which the asymmetric intensity distribution of Bijvoet reflections is evident, increases as the accelerating voltage is increased. When the crystal thickness is small, however, the intensity asymmetry is more pronounced as the accelerating voltage is decreased due to the increased propensity of multiple scattering.
Keywords
A. Silicides , various , F. Diffraction , B. Crystallography , transmission , F. Electron microscopy
Journal title
Intermetallics
Serial Year
2007
Journal title
Intermetallics
Record number
1503835
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