• Title of article

    Electronic mechanism of shear modulus enhancement in rare earth intermetallics Yb1−xTmxAl3

  • Author/Authors

    Sa، نويسنده , , Baisheng and Zhou، نويسنده , , Jian and Sun، نويسنده , , Zhimei، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2011
  • Pages
    4
  • From page
    1020
  • To page
    1023
  • Abstract
    Rare earth elements doped thermoelectric materials Yb1−xMxAl3 (M = Ho, Er and Tm) demonstrated anomalously enhanced shear modulus [Zhou J et al, Intermetallics, 2010; 18:2394]. However, the origin of the shear modulus enhancement has not yet been understood. In this work, we shed light on this mechanism by systematically analyzing the band structure and charge density near the Fermi energy of Yb1−xTmxAl3 under various shear stresses on the basis of ab initio total energy calculations. We have showed that the valence band maximum (VBM) is very sensitive to shearing and plays an important role for the shear modulus enhancement. Since the valence electron structures of Ho, Er and Tm in Yb1−xMxAl3 (M = Ho, Er and Tm) alloys are very similar, the present results will provide a fundamental understanding on the electronic origin of shear properties in these rare earth intermetallics.
  • Keywords
    Calculation , A. Aluminides , miscellaneous , B. Elastic properties , E. Ab initio calculations , E. Electronic structure
  • Journal title
    Intermetallics
  • Serial Year
    2011
  • Journal title
    Intermetallics
  • Record number

    1505059