Powder X-ray diffraction pattern of NbSi1.9 containing planar stacking faults

The X-ray powder diffraction pattern of NbSi1.9 prepared by heating Nb and Si powders with Na at 900 K for 48 h in Ar was analyzed by the Rietveld method. The broadening peaks of X-ray reflections suggested stacking faults of the C40 structure. The XRD pattern was simulated with a stacking fault model using DIFFaX.