Measurements of coeluting unlabeled and 13C-labeled polychlorinated biphenyl congeners with partially overlapping fragment profiles using a tandem mass spectrometry

13C-labeled compounds are often employed as surrogate or internal standards to monitor the performance of extraction and instrumental analysis procedures for their unlabeled counterparts. However, labeled and unlabeled counterparts most often coelute chromatographically with overlapping mass ion fragments, posing a challenge to the accurate quantification of these compounds. In the present study, an analytical scheme, using coeluting unlabeled and 13C-labeled polychlorinated biphenyl (PCB) congeners as the model compounds, was developed with a low-resolution tandem mass spectrometer (MS/MS) to determine the appropriate ranges of PCB congener concentrations that satisfy the no-interference condition. Interferences from unlabeled PCBs to quantitation of labeled counterparts could be minimized when 13C-labeled PCB congeners were quantified in the MS/MS mode within a certain concentration range. In addition, good agreements between the measured and theoretically predicted quantitation errors were observed for all labeled PCB congeners except PCB 180. The exception with labeled PCB 180 was mainly attributed to the occurrence of instrumental analytical uncertainty, as analytical error was also observed with absence of unlabeled PCB 180. These results indicate that MS/MS techniques can serve as a useful tool to minimize interferences with quantitation of isotopically labeled compounds from their unlabeled counterparts, which possess partially overlapping ion fragment profiles.