XRD investigation of Si-SiC composites with fine SiC microstructure

Using a recent proposed analysis procedure for quantitative phase determination by X-ray powder diffraction, YBa2Cu3O7-x solid state formation reaction kinetics at 900 °C was studied. Although there was the presence of partial amorphous components, it was possible to determine a reaction route for the synthesis of the title compound from X-ray powder diffraction data collected at various stages of the thermal treatment and using the Rietveld method for the quantitative determination of the phase composition.