Title of article :
Investigation of the slice sensitivity profile for step-and-shoot mode multi-slice computed tomography
Author/Authors :
Hsieh، Jiang نويسنده ,
Issue Information :
فصلنامه با شماره پیاپی سال 2014
Pages :
-490
From page :
491
To page :
0
Abstract :
Multislice computed tomography (MCT) is one of the recent technology advancements in CT. Compared to single slice CT, MCT significantly improves examination time, xray tube efficiency, and contrast material utilization. Although the scan mode of MCT is predominately helical, step-and-shoot (axial) scans continue to be an important part of routine clinical protocols. In this paper, we present a detailed investigation on the slice sensitivity profile (SSP) of MCT in the step-and-shoot mode. Our investigation shows that, unlike single slice CT, the SSP for MCT exhibits multiple peaks and valleys resulting from intercell gaps between detector rows. To fully understand the characteristics of the SSP, we developed an analytical model to predict the behavior of MCT. We propose a simple experimental technique that can quickly and accurately measure SSP. The impact of the SSP on image artifacts and low contrast detectability is also investigated.
Keywords :
Fault current limiter , short circuit current , transient over voltage , power quality
Journal title :
MEDICAL PHYSICS
Serial Year :
2001
Journal title :
MEDICAL PHYSICS
Record number :
1543
Link To Document :
بازگشت