Duality method for limit analysis of dielectrics in powerful electric fields

The limit analysis problem (LAP) for the estimation of electric durability for a dielectric in a powerful electric field is examined. The appropriate dual problem is formulated. After the standard piecewise linear continuous finite-element approximation, the dual LAP is transformed into the problem of mathematical programming with linear limitations as equalities. This finite dimension problem is effectively solved by the standard method of gradient projection.