Title of article :
A general Bayes weibull inference model for accelerated life testing
Author/Authors :
René Van Dorp، نويسنده , , J. and Mazzuchi، نويسنده , , Thomas A.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
8
From page :
140
To page :
147
Abstract :
This article presents the development of a general Bayes inference model for accelerated life testing. The failure times at a constant stress level are assumed to belong to a Weibull distribution, but the specification of strict adherence to a parametric time-transformation function is not required. Rather, prior information is used to indirectly define a multivariate prior distribution for the scale parameters at the various stress levels and the common shape parameter. Using the approach, Bayes point estimates as well as probability statements for use-stress (and accelerated) life parameters may be inferred from a host of testing scenarios. The inference procedure accommodates both the interval data sampling strategy and type I censored sampling strategy for the collection of ALT test data. The inference procedure uses the well-known MCMC (Markov Chain Monte Carlo) methods to derive posterior approximations. The approach is illustrated with an example.
Keywords :
Dirichlet distribution , Step-stress testing , Environmental testing
Journal title :
Reliability Engineering and System Safety
Serial Year :
2005
Journal title :
Reliability Engineering and System Safety
Record number :
1568999
Link To Document :
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