Title of article :
ATOMIC FORCE MICROSCOPY OF ELASTOMERS: MORPHOLOGY, DISTRIBUTION OF FILLER PARTICLES, AND ADHESION USING CHEMICALLY MODIFIED TIPS
Author/Authors :
HAERINGEN، D. TRIFONOVA-VAN نويسنده , , SCHONHF.RR، H. نويسنده , , VANCSO، G. J. نويسنده , , DUES، L. VAN DF.R نويسنده , , NUORDERMFER، J. W. M. نويسنده , , JANSSEN، P. J. P. نويسنده ,
Issue Information :
فصلنامه با شماره پیاپی سال 1999
Pages :
-861
From page :
862
To page :
0
Abstract :
The microdispersion of silica and carbon black-based filler particles in unvulcanized and vulcanized-propylenediene tcrpolymer (EPDM) rubber was investigated by atomic force microscopy (AFM). tapping mode phase imaging was found to be particularly useful for imaging of the filler aggregates and for the visualization of single primary filler particles. It was demonstrated that the use of silane coupling agents significantly improves the microdispersion of silica filler in the rubber matrix, as compared to (a) silica without coupling agent, and (b) to carbon black. These results correlate very well with the observed mechanical properties of the materials. In addition, adhesion imaging and the analysis of measured pulloff forces allowed us to differentiate between the filler particles and the rubber matrix, as well as between different types of filler particles. The application of chemically modified AFM tips in pull-offʹ force measurements allowed us to monitor the increase of the hydrophilicity as a result of plasma treatment of the surface of crosslinked poly(dimethylsiloxane), and as a result of chlorination of butyl rubber.
Keywords :
semiconductor manufacturing , wafer fab. , dispatching
Journal title :
Rubber Chemistry and Technology
Serial Year :
1999
Journal title :
Rubber Chemistry and Technology
Record number :
16023
Link To Document :
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