The effect of partial gelatinization of corn starch on its retrogradation

The objective of this work was to investigate the effect of partial gelatinization of starch on its retrogradation using differential scanning calorimetry (DSC) and X-ray diffraction (XRD) techniques. The Avrami equation was used to predict the evolution of starch retrogradation kinetics. The degree of retrogradation in starch samples partially gelatinized 64 °C (S64), 68 °C (S68) and 70 °C (S70) and control (S25) increased with storage time. The retrogradation enthalpies of S68 and S70 were almost four times as high as that of S64. The S25 and S64 had dominant A-type crystalline pattern while S68 and S70 showed dominant B-type crystalline pattern. The growth of remainder crystals was faster in S25 and S64, while both the nucleation and growth rates of new crystals were faster in S68 and S70. The Avrami model was found to represent the retrogradation kinetics data of these partially gelatinized starch samples quite satisfactorily (R2 > 0.95).