Title of article
Zircaloy-2 secondary phase precipitate analysis by X-ray microspectroscopy
Author/Authors
Degueldre، نويسنده , , C. and Raabe، نويسنده , , J. and Kuri، نويسنده , , G. and Abolhassani-Dadras، نويسنده , , S.، نويسنده ,
Issue Information
ماهنامه با شماره پیاپی سال 2008
Pages
5
From page
402
To page
406
Abstract
Secondary phase precipitates of a Zircaloy sample have been characterised by X-ray microspectroscopy. In Zircaloy-2 X-ray microscopy reveals pictures with a 40 nm resolution identifying Fe, Cr and to a lower occurrence Ni phases up to size of the micrometer. Analysis by X-ray spectroscopy defines the structure of specific secondary phase precipitates. The feasibility tests demonstrate that the characterisation of Fe and Cr can be performed on 100 nm size phases allowing the analysis of the Fe or Cr atoms environment in these secondary phase precipitates.
Keywords
Secondary phases precipitate , X-ray microspectroscopy , Zircaloy
Journal title
Talanta
Serial Year
2008
Journal title
Talanta
Record number
1654522
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