Title of article :
Hydrogen absorption by metallic thin films detected by optical transmittance measurements
Author/Authors :
Cabrera، نويسنده , , A.L. and Avila، نويسنده , , J.I. and Lederman، نويسنده , , David، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Abstract :
The hydrogen absorption by bilayers of Pd/Nb and Pd/Ti, grown on glass substrates, was studied by measuring changes in optical transmittance and reflectance in the visible range (wavelengths between 400 nm and 1000 nm) of the films at hydrogen pressures between 3.99 × 102 and 4.65 × 104 Pa. The electrical resistance of the films was also measured during absorption to correlate with the optical data. All the films were grown by a controlled sputtering technique in high vacuum. Pd films ranging in thickness between 4 nm and 45 nm were also characterized when the films were exposed to a hydrogen pressure. The resistance and transmittance of all the Pd samples increased with the uptake of hydrogen until saturation occurred. For Pd/Ti bilayers, fast uptake of hydrogen was deduced from a transmittance increase, indicating hydrogen absorption in the Ti layer. In the case of the Pd/Nb bilayer, a decrease in transmittance was observed, indicating that hydrogen was not absorbed in the Nb layer. The transmittance decrease could be explained by a reduction of Nb native oxide by the hydrogen at the surface.
Keywords :
Hydrogen , ABSORPTION , Niobium and titanium sputtered films , Palladium thin films , optical transmittance , Resistance of films
Journal title :
International Journal of Hydrogen Energy
Journal title :
International Journal of Hydrogen Energy