Title of article :
Electrodissolution of Ti and p-Si in acidic fluoride media: formation ratio of oxide layers from electrochemical impedance spectroscopy
Author/Authors :
I. Frateur، نويسنده , , Isabelle and Cattarin، نويسنده , , Sandro and Musiani، نويسنده , , Marco and Tribollet، نويسنده , , Bernard، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
The electrodissolution of Ti and p-Si electrodes in acidic fluoride solutions has been investigated by electrochemical impedance spectroscopy as a function of potential E, fluoride concentration, pH and angular speed of the electrode, with the aim of characterising the oxide layers covering both materials. The impedance diagrams have been analysed to obtain the low frequency capacitance Clf, the high frequency capacitance Chf and the product RhfI (where Rhf is the high frequency resistance and I the steady-state current). In the potential domain where the oxide thickness x is proportional to E, the formation ratio dx/dE has been computed from Clf, Chf and RhfI. The calculated values have been found to be in good mutual agreement and close to the ones found in the literature.
Keywords :
Electropolishing , resistance , SiO2 , Hydrofluoric acid , capacitance , TIO2
Journal title :
Journal of Electroanalytical Chemistry
Journal title :
Journal of Electroanalytical Chemistry