Title of article :
Multi-ion transport and reaction simulations in turbulent parallel plate flow
Author/Authors :
Nelissen، نويسنده , , Gert and Van Theemsche، نويسنده , , Achim and Dan، نويسنده , , Calin and Van den Bossche، نويسنده , , Bart and Deconinck، نويسنده , , Johan، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
8
From page :
213
To page :
220
Abstract :
The residual distribution method is used to solve the multi-ion transport and reaction model in turbulent flow. The model describes the effects of convection, diffusion, migration, chemical reactions and electrode reactions on the concentration, potential and current density distributions in an electrochemical reactor. The Reynolds averaged Navier–Stokes (RANS) equations are used to calculate the turbulent flow, with the turbulent viscosity obtained from a low-Reynolds number k–ω model. Different turbulence models for the turbulent mass transfer are examined and validated in a parallel plate reactor for the deposition of Cu from an acid copper-plating bath. The most accurate turbulent mass transfer models are the algebraic model for the turbulent diffusion and the newly suggested model with the constant turbulent Schmidt number equal to 4.5. Furthermore, it is shown that the turbulence model for the mass transfer influences the local concentration distribution considerably but has much less effect on the current density distribution.
Keywords :
Parallel plate reactor , Current density distribution , concentration profiles , Finite element method , Turbulent mass transfer
Journal title :
Journal of Electroanalytical Chemistry
Serial Year :
2004
Journal title :
Journal of Electroanalytical Chemistry
Record number :
1669900
Link To Document :
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