Title of article :
Cathodic behavior of bismuth. I. Ellipsometric study of the electroreduction of thin Bi2O3 films
Author/Authors :
Pérez، نويسنده , , M.A. and Lَpez Teijelo، نويسنده , , M.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
9
From page :
212
To page :
220
Abstract :
The electroreduction of thin Bi2O3 films was characterized by employing electrochemical techniques and in situ ellipsometry. The electroreduction optical response is described in terms of a bilayer model. The optical analysis indicates that electroreduction proceeds yielding a rough/porous layer of metallic bismuth at the oxide/electrolyte interface, that grows inwards at the expense of the underneath oxide layer to completely exhaust it. At the end of oxide electroreduction, the aging process of the porous metallic bismuth layer could be detected. On this framework, changes in the oxide growth kinetics observed on electroreduced surfaces can be consistently explained.
Keywords :
Oxide electroreduction , Oxide growth , Bismuth oxide , ellipsometry
Journal title :
Journal of Electroanalytical Chemistry
Serial Year :
2005
Journal title :
Journal of Electroanalytical Chemistry
Record number :
1671875
Link To Document :
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