Title of article
An atomic force microscopic investigation of electro-sensitive polymer surface
Author/Authors
Song، نويسنده , , Wenlong and Sun، نويسنده , , Taolei and Song، نويسنده , , Yanlin and Bai، نويسنده , , Yubai and Liu، نويسنده , , Fengqi and Jiang، نويسنده , , Lei، نويسنده ,
Issue Information
ماهنامه با شماره پیاپی سال 2005
Pages
5
From page
543
To page
547
Abstract
An electro-sensitive poly(2-acrylamide-2-methylpropane sulfonic acid) (PAMPS) film was fabricated by surface-initiated atom transfer radical polymerization (ATRP) method on silicon substrate. Atomic force microscopy (AFM) experiments in contact mode show that friction force and the adhesion force between the AFM tip and the film may change regularly with the alteration of the applied negative bias voltage between them, indicating that the microscopic wettability of the film can be adjusted by external electric field. On the other hand, the AFM experiments in tapping mode reveal that the film may take corresponding phase change under the electric field. These effects were considered to result from the conformational overturn of the sulfonic groups and the adjacent alkyl chains in the electric field.
Keywords
AFM , adhesion force , atom transfer radical polymerization , Electro-sensitive polymer surface
Journal title
Talanta
Serial Year
2005
Journal title
Talanta
Record number
1674579
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