Title of article
Copper wetting of α-Al2O3(0001): theory and experiment
Author/Authors
Kelber، نويسنده , , J.A. and Niu، نويسنده , , Chengyu and Shepherd، نويسنده , , K. and Jennison، نويسنده , , D.R. and Bogicevic، نويسنده , , A.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2000
Pages
13
From page
76
To page
88
Abstract
X-ray photoelectron spectroscopy (XPS) studies have been carried out on sputter deposited copper on a substantially hydroxylated α-Al2O3(0001) (sapphire) surface under ultra-high vacuum (UHV) conditions. XPS-derived Cu uptake curves show a sharp change in slope at a coverage of 0.35 ML (on a Cu/O atomic basis), indicative of initial layer-by-layer growth. Cu(LMM) lineshape data indicate that, prior to the first break in the curve, Cu is oxidized to Cu(I). At higher coverages, metallic Cu(0) is observed. These data agree with first principles theoretical calculations, indicating that the presence of adhydroxyl groups greatly enhances the binding of Cu to bulk sapphire surfaces, stabilizing Cu(I) adatoms over two-dimensional metallic islands. In the absence of hydroxylation, calculations indicate significantly weaker Cu binding to the bulk sapphire substrate and non-wetting. Calculations also predict that at Cu coverages above 1/3 ML, CuCu interactions predominate, leading to Cu(0) formation. These results are in excellent agreement with experiment. The ability of surface hydroxyl groups to enhance binding to alumina substrates suggests a reason for contradictory experimental results reported in the literature for Cu wetting of alumina.
Keywords
X-ray photoelectron spectroscopy , Aluminum oxide , Ab initio quantum chemical methods and calculations , Chemisorption , Copper , Sputter deposition , Wetting
Journal title
Surface Science
Serial Year
2000
Journal title
Surface Science
Record number
1677680
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