Author/Authors :
Oshima، نويسنده , , Yoshifumi and Nakade، نويسنده , , Hiroyuki and Shigeki، نويسنده , , Sinya and Hirayama، نويسنده , , Hiroyuki and Takayanagi، نويسنده , , Kunio، نويسنده ,
Abstract :
Growths of Ag islands on Si(1 1 1)3×3-Ag surface at room temperature were observed by UHV transmission electron microscopy and diffraction. The Ag islands grown after six monolayer deposition had neither (1 0 0) nor (1 1 0) orientation, but had two complex epitaxial orientations dominantly. One was striped islands which gave rise to a diffraction pattern commensurate with the 3×3 lattice of the Si(1 1 1) surface. The other was the coagulated islands whose diffraction pattern indicated the Ag(1 −3 4) sheet grown parallel to the Si(1 1 1) surface.
Keywords :
Electron microscopy , Electron–solid diffraction , Silicon , silver
