• Title of article

    Gaussian distribution of inhomogeneous barrier height in Si Schottky barriers

  • Author/Authors

    Maeda، نويسنده , , Keiji، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2001
  • Pages
    9
  • From page
    644
  • To page
    652
  • Abstract
    Deviations from the ideal characteristics in actual nearly ideal Schottky barriers (SBs) are due to inhomogeneous distributions of the Schottky barrier height (SBH) φ. By assuming the distribution as a Gaussian of the standard deviation σ from the ideal SBH ΦB, the SB characteristics have been qualitatively explained. However, the reason is unknown why the SBH distribution is a Gaussian. From the observed temperature dependence of σ, the distribution is found to exponentially decay more gradually than the Gaussian at large ΦB−φ values. According to our model of the local SBH lowering by ionized donors in Si SBs, the SBH distribution represents the spatial distribution of the ionized donors from the interface. The energy levels of the ionized donor decrease, become broad with approaching the interface, and are in ionization equilibrium with the Fermi level. The Gaussian distribution of the inhomogeneous SBH in Si SBs is consistently understood by our microscopic model.
  • Keywords
    Metal–semiconductor interfaces , Surface electronic phenomena (work function , Surface states , etc.) , Schottky barrier , Surface potential , Silicon
  • Journal title
    Surface Science
  • Serial Year
    2001
  • Journal title
    Surface Science
  • Record number

    1678284