Title of article :
A theoretical treatment of void electromigration in the strip geometry
Author/Authors :
Amar، نويسنده , , M.Ben and Cummings، نويسنده , , L.J. and Richardson، نويسنده , , G.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
The void electromigration process in the strip geometry is investigated analytically and numerically. The void is assumed to travel either along the axis of symmetry of the metal strip or at the boundary. In each case, the shape, the velocity of the void and the characteristic electrical current are predicted.
Journal title :
Computational Materials Science
Journal title :
Computational Materials Science
