Title of article
Structural characterisation and homoepitaxial growth on Cu(111)
Author/Authors
Camarero، نويسنده , , J. and de la Figuera، نويسنده , , J. and de Miguel، نويسنده , , J.J. and Miranda، نويسنده , , R. and ءlvarez، نويسنده , , J. and Ferrer، نويسنده , , S.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2000
Pages
15
From page
191
To page
205
Abstract
A comprehensive study of the homoepitaxial MBE growth of Cu on Cu(111) is presented. This system displays a wealth of features and a large accumulation of morphological and structural defects. It is demonstrated that all of them can be ascribed to two basic characteristics of fcc-(111) faces: the presence of two threefold adsorption sites at the surface, which allows the formation of stacking faults, and the existence of high Ehrlich–Schwoebel barriers at steps, hindering interlayer diffusion. This behaviour, therefore, must be common during growth on compact metallic faces, and could have important implications for the preparation of low-dimensional heterostructures.
Keywords
Copper , Molecular Beam Epitaxy , Diffusion and migration , morphology , Surface defects , and topography , surface structure , Diffraction , X-Ray scattering , and reflection , Atom–solid scattering and diffraction – elastic , Roughness
Journal title
Surface Science
Serial Year
2000
Journal title
Surface Science
Record number
1679106
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