• Title of article

    Structural characterisation and homoepitaxial growth on Cu(111)

  • Author/Authors

    Camarero، نويسنده , , J. and de la Figuera، نويسنده , , J. and de Miguel، نويسنده , , J.J. and Miranda، نويسنده , , R. and ءlvarez، نويسنده , , J. and Ferrer، نويسنده , , S.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2000
  • Pages
    15
  • From page
    191
  • To page
    205
  • Abstract
    A comprehensive study of the homoepitaxial MBE growth of Cu on Cu(111) is presented. This system displays a wealth of features and a large accumulation of morphological and structural defects. It is demonstrated that all of them can be ascribed to two basic characteristics of fcc-(111) faces: the presence of two threefold adsorption sites at the surface, which allows the formation of stacking faults, and the existence of high Ehrlich–Schwoebel barriers at steps, hindering interlayer diffusion. This behaviour, therefore, must be common during growth on compact metallic faces, and could have important implications for the preparation of low-dimensional heterostructures.
  • Keywords
    Copper , Molecular Beam Epitaxy , Diffusion and migration , morphology , Surface defects , and topography , surface structure , Diffraction , X-Ray scattering , and reflection , Atom–solid scattering and diffraction – elastic , Roughness
  • Journal title
    Surface Science
  • Serial Year
    2000
  • Journal title
    Surface Science
  • Record number

    1679106