Title of article :
Role of hydrogen prepairing in the hydrogen desorption kinetics from Si(100)-2×1: effects of hydrogenating-gas and thermal history
Author/Authors :
Nakazawa، نويسنده , , Hideki and Suemitsu، نويسنده , , Maki and Miyamoto، نويسنده , , Nobuo، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2000
Abstract :
Hydrogen desorption kinetics from Si(100)-2×1:H has been systematically investigated using temperature-programmed desorption (TPD) on several hydrogenating gases and thermal conditions. As a result, the desorption kinetic order with the hydrogen coverage was found to increase in the order: atomic hydrogen<disilane<silane and room-temperature adsorption<high-temperature adsorption<post-annealing. These variations in kinetic order, depicted as a TPD peak shift at low hydrogen coverages, are universally described with a single surface parameter, γ0, the fractional coverage of unpaired hydrogen atoms. Fitting with obtained TPD spectra demonstrates that γ0 is a delicate function of the hydrogenating gas and thermal history.
Keywords :
Molecular Beam Epitaxy , hydrogen atom , chemical vapor deposition , Silicon , surface diffusion , Thermal desorption spectroscopy , Surface thermodynamics (including phase transitions)
Journal title :
Surface Science
Journal title :
Surface Science