Title of article :
The identification of soft X-ray lines
Author/Authors :
Aكmann، نويسنده , , Andrea and Wendt، نويسنده , , Michael، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
6
From page :
711
To page :
716
Abstract :
For soft X-rays, in the range 100⩽hν⩽700 eV, new data of the relative intensities of L and M lines are presented which differ from those given in the popular tables prepared by E.W. White and G.G. Johnson by up to two orders of magnitude. The new data may be helpful in identifying soft X-ray lines correctly. Finally, some selected cases of severe overlaps between principal lines are discussed.
Keywords :
Relative line intensities , Line overlaps , electron probe microanalysis , Soft X-ray spectra
Journal title :
Spectrochimica Acta Part B Atomic Spectroscopy
Serial Year :
2003
Journal title :
Spectrochimica Acta Part B Atomic Spectroscopy
Record number :
1679701
Link To Document :
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