Title of article
The identification of soft X-ray lines
Author/Authors
Aكmann، نويسنده , , Andrea and Wendt، نويسنده , , Michael، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
6
From page
711
To page
716
Abstract
For soft X-rays, in the range 100⩽hν⩽700 eV, new data of the relative intensities of L and M lines are presented which differ from those given in the popular tables prepared by E.W. White and G.G. Johnson by up to two orders of magnitude. The new data may be helpful in identifying soft X-ray lines correctly. Finally, some selected cases of severe overlaps between principal lines are discussed.
Keywords
Relative line intensities , Line overlaps , electron probe microanalysis , Soft X-ray spectra
Journal title
Spectrochimica Acta Part B Atomic Spectroscopy
Serial Year
2003
Journal title
Spectrochimica Acta Part B Atomic Spectroscopy
Record number
1679701
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