Title of article :
Interlayer relaxation of W(1 1 0) studied by surface X-ray diffraction
Author/Authors :
Meyerheim، نويسنده , , H.L. and Sander، نويسنده , , D. and Popescu، نويسنده , , R. and Steadman، نويسنده , , P. and Ferrer، نويسنده , , S. and Kirschner، نويسنده , , J.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2001
Abstract :
The structure of the clean, unreconstructed W(1 1 0) surface was investigated by surface X-ray diffraction. The analysis of the integer order crystal truncation rods up to a maximum momentum transfer of four reciprocal lattice units indicates a contraction of the first interlayer distance by Δd12=−2.7(5)% relative to the bulk interlayer distance (dbulk=2.238 Å). The relaxation of the second interlayer spacing is found to be smaller than 0.3%. Within the error bars our results agree with recent low energy electron diffraction studies. However, Δd12 is lower than predicted by recent calculations (−4.1%).
Keywords :
and reflection , Tungsten , Roughness , surface structure , Diffraction , morphology , and topography , X-Ray scattering
Journal title :
Surface Science
Journal title :
Surface Science