Element-selective detection of gas chromatographic eluates by near infrared ةchelle optical emission spectrometry on microwave-induced plasmas

Specific analytical characteristics of near-infrared Échelle microwave-induced plasma atomic emission spectrometry (NIR-Échelle-MIP-OES) with respect to the quantification of organic compounds were examined. Matrices consisting of halogenated and sulfureous hydrocarbons were gas chromatographically separated and subsequently H-, C-, F-, Cl-, Br-, I- and S-selectively analyzed. For these purposes, a compact Échelle spectrometer, designed for the high-repetitive, high-resolved and simultaneous spectra acquisition between 640 and 990 nm was used. Depending on the plasma gas applied and element considered, detection limits typically varied from 200–2200 pg/s for Ar to 70–660 pg/s for He. Furthermore, strategies to improve the over-all sensitivity are discussed. In this context, a concept, which rests on simultaneous multi-line analysis is described and experimentally proofed.