• Title of article

    Two types of sulfur-induced (2×1) reconstructions on InP(0 0 1)

  • Author/Authors

    Preobrajenski، نويسنده , , A.B. and Gebhardt، نويسنده , , R.K. and Uhlig، نويسنده , , I. and Chassé، نويسنده , , T.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2001
  • Pages
    12
  • From page
    1
  • To page
    12
  • Abstract
    A novel method of surface sulfurization based on in situ PbS deposition at elevated substrate temperatures followed by successive annealing has been used for investigation of sulfur-induced surface reconstructions on InP(0 0 1)-(2×4). Two different (2×1) reconstructions have been observed by low-energy electron diffraction at 200–410°C and 420–445°C, respectively, separated from each other by a (1×1) pattern in the range of 410–420°C. A consistent examination of the results provided by electron diffraction and photoemission techniques has allowed us to propose models of atomic arrangement for both observed (2×1) structures.
  • Keywords
    Indium phosphide , Photoelectron spectroscopy , and topography , Roughness , Sulphur , Low energy electron diffraction (LEED) , morphology , surface structure , Semiconducting surfaces
  • Journal title
    Surface Science
  • Serial Year
    2001
  • Journal title
    Surface Science
  • Record number

    1680273