Title of article :
Characterization of epitaxial growth of Fe(1 1 0) on (1 1−2 0) sapphire substrates driven by Mo(1 1 0) seed layers
Author/Authors :
May، نويسنده , , U. and Calarco، نويسنده , , R. and Hauch، نويسنده , , J.O. and Kittur، نويسنده , , H. and Fonine، نويسنده , , M. and Rüdiger، نويسنده , , U. and Güntherodt، نويسنده , , G.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2001
Pages :
7
From page :
144
To page :
150
Abstract :
The molecular beam epitaxy (MBE) growth of bcc Fe(1 1 0) thin films on an Al2O3(1 1 −2 0) substrate using Mo(1 1 0) seed layers has been investigated. The growth was studied by reflection high energy electron diffraction (RHEED) in reciprocal space as well as by scanning tunneling microscopy in real space. The relative orientation between the lattices of the Fe(1 1 0) layer and the Al2O3(1 1 −2 0) substrate has been identified and has enabled the construction of a model of the in-plane atomic arrangements. Side reflections found in RHEED patterns indicate the formation of ordered relaxation lines along the [1 0 0] direction of the Fe(1 1 0).
Keywords :
epitaxy , Metallic surfaces , Iron , Molybdenum , growth , Scanning tunneling microscopy , Molecular Beam Epitaxy , Reflection high-energy electron diffraction (RHEED)
Journal title :
Surface Science
Serial Year :
2001
Journal title :
Surface Science
Record number :
1680579
Link To Document :
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