Title of article :
Understanding crystal growth in vacuum and beyond
Author/Authors :
Vlieg، نويسنده , , Elias، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2002
Pages :
17
From page :
458
To page :
474
Abstract :
For a detailed understanding of crystal growth, the atomic-scale structure of the growing interface must be known. While such knowledge is available in vacuum environments, this is not the case if the crystal grows from a solution, melt or solid. X-ray diffraction is one of the few techniques that can be applied for this purpose and it is starting to provide information on the structure of both sides of a growing interface. This means that structural details like relaxation and reconstruction on the crystal surface and ordering in the solution can be included in the theoretical description of crystal growth.
Keywords :
morphology , and topography , Roughness , Solid–liquid interfaces , X-Ray scattering , and reflection , growth , Molecular Beam Epitaxy , Diffraction , Surface relaxation and reconstruction , surface structure
Journal title :
Surface Science
Serial Year :
2002
Journal title :
Surface Science
Record number :
1681088
Link To Document :
بازگشت