• Title of article

    Real time STM observation of Au-assisted decomposition of SiO2 films on Si(1 1 1) at elevated temperatures

  • Author/Authors

    Jun، نويسنده , , Wang and Mitchell، نويسنده , , C.E.J. and Egdell، نويسنده , , R.G. and Foord، نويسنده , , J.S.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2002
  • Pages
    14
  • From page
    66
  • To page
    79
  • Abstract
    The decomposition of ultrathin layers of SiO2 on Si(1 1 1) has been studied in real time in a high temperature scanning tunnelling microscope. Deposition of Au onto the SiO2 surface lowers the temperature of decomposition from 1000 to 940 K. Film decomposition takes place initially at step edges. The mechanism is shown to involve nucleation of Au nanoparticles at step edges, “sinking” of the Au particles to the buried SiO2/Si interface and accelerated reaction of substrate Si with SiO2 around Au nuclei. The Au/Si surface left after film decomposition supports a row-like reconstruction with a periodicity six times that of Si(1 1 1).
  • Keywords
    Scanning tunneling microscopy , Silicon oxides , Gold , surface diffusion , surface structure , morphology , Roughness , Oxidation , and topography
  • Journal title
    Surface Science
  • Serial Year
    2002
  • Journal title
    Surface Science
  • Record number

    1681159