Calibration of wavelength-dispersive X-ray spectrometer for standardless analysis

An experimental procedure for calibrating wavelength-dispersive X-ray spectrometer is presented. The detection efficiency was determined from the ratio of fluorescent radiation measured using the flow-proportional and the scintillation counter. The relative reflection efficiency of the analyzing crystal for various wavelengths was determined from the X-ray measurements of standard samples. The absorption correction for the atmosphere in the spectrometer chamber was also experimentally examined. All parameters (with the exception of reflection efficiency of the analyzing crystal) can be calculated from the X-ray measurements of unknown samples.