Title of article
Step wandering due to the gap in diffusion coefficient on the upper and the lower terraces
Author/Authors
Kato، نويسنده , , R. and Uwaha، نويسنده , , M. and Saito، نويسنده , , Y. and Hibino، نويسنده , , H.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2003
Pages
11
From page
64
To page
74
Abstract
In a vicinal face of a crystal, wandering instability of steps may occur under nonequilibrium conditions when asymmetry in the surface diffusion field exists. Near the transition temperature of Si(1 1 1) surface between 1×1 and 7×7 structures, wandering instability is observed in growth. We provisionally attribute this instability to the gap in diffusion coefficient on the upper and the lower terraces whose surface structures are different. With linear stability analysis and Monte Carlo simulation, we show that the instability occurs in growth if the diffusion coefficient of the lower terrace is larger. The wandering pattern in a vicinal face is chaotic when evaporation is allowed, but is rather periodic when evaporation is absent. The latter result agrees with the experimental observation.
Keywords
Monte Carlo simulations , growth , surface structure , morphology , Silicon , Roughness , and topography , surface diffusion
Journal title
Surface Science
Serial Year
2003
Journal title
Surface Science
Record number
1681815
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